Seminar: Dr. Yaw Obeng, NIST

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Seminar: Dr. Yaw Obeng, NIST

December 06, 2017 at 3:00pm to at 4:00pm

Title: Applications of Broadband Dielectric Spectroscopy to Stress Induced Material Evolution in3_D  Integrated Systems

Speaker: Dr. Yaw Obeng, NIST

Abstract: The Broadband Dielectric Spectroscopy (BDS) leverages the interaction of electromagnetic radiation with matter to induce molecular rotations (instead of vibronic transitions in UV-Visible-IR spectroscopy) in solid state materials.  BDS measurements provide both electrical and chemical information to guide the reliable integration of material into more solid designs for the intended applications, and for monitoring the manufacturing process. These RF-dielectric material interactions are reasonably granular and uniquely suitable for studying the buried structures and material interfaces inherent in integrated circuit devices. We have demonstrated the application of broadband radio frequency dielectric spectroscopy (BDS) in addressing the metrology gaps in the material evolution during semiconductor device aging.  We have also uses the same techniques to characterize bio-based systems, such as  high value paper products.

In this talk I will review several BDS applications in determining the dominant failure mechanisms in emerging 3D integrated electronic devices, and propose potential application of BDS in biological systems. 


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